04/24/2015: New AFM/STM/SECM/MFM Installed in TongLab

Yirmi from Nanonics in Israel came to TongLab this week to install the newly purchased (with NSF grant) SPM (scanning probe microscope). This SPM has multi-mode operations that include AFM(atomic force microscope), STM(scanning tunneling microscope), SECM(scanning electrochemical microscope) and MFM(magnetic force microscope). Yirmi also offered initial training to TongLab members. This powerful state-of-the-art instrument will become a major workhorse in TongLab in developing novel nanoscale measurement methodologies including tip enhanced Raman spectroscopy, nitrogen vacancy based NMR microscope, and electrochemically gated nanoscale conductance measurement.