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Post date: Apr 24, 2015 5:14:16 PM
Yirmi from Nanonics in Israel came to TongLab this week to install the newly purchased (with NSF grant) SPM (scanning probe microscope). This SPM has multi-mode operations that include AFM(atomic force microscope), STM(scanning tunneling microscope), SECM(scanning electrochemical microscope) and MFM(magnetic force microscope). Yirmi also offered initial training to TongLab members. This powerful state-of-the-art instrument will become a major workhorse in TongLab in developing novel nanoscale measurement methodologies including tip enhanced Raman spectroscopy, nitrogen vacancy based NMR microscope, and electrochemically gated nanoscale conductance measurement.
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